DocumentCode :
2121600
Title :
Power-on contention elimination [CMOS digital circuits]
Author :
Taylor, G. ; Wong, K.
Author_Institution :
Intel Corp., Hillsboro, OR, USA
fYear :
1996
fDate :
13-15 June 1996
Firstpage :
22
Lastpage :
23
Abstract :
If ignored, power-on contention will eventually become intolerable. If ignored on current processes it will lead to increased fallout at burn-in. On future processes it may lead to fallout at the normal operating supply for a chip. Fortunately, a straightforward design solution is available which permits a chip to avoid power-on contention failures. The authors describe this design solution.
Keywords :
CMOS digital integrated circuits; integrated circuit design; CMOS digital circuits; design solution; power-on contention elimination; CMOS digital integrated circuits; Digital circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1996. Digest of Technical Papers., 1996 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-3339-X
Type :
conf
DOI :
10.1109/VLSIC.1996.507701
Filename :
507701
Link To Document :
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