DocumentCode :
2121828
Title :
Microhardness and elastic properties of bulk glasses and thin films of the Gex-Sb40-x-S60 family
Author :
Pamukchieva, V. ; Savova, E. ; Skordeva, E. ; Popescu, M. ; Sava, F. ; Lörinczi, A.
Author_Institution :
Inst. of Solid State Phys., Bulgarian Acad. of Sci., Sofia, Bulgaria
Volume :
2
fYear :
1996
fDate :
9-12 Oct 1996
Firstpage :
373
Abstract :
The microhardnesses (H) of bulk glasses and thin films in the Gex-Sb40-xS60 family has been measured. The volume of the micro-voids (Vh), their formation energy (Eh) and the module of elasticity (E) have been calculated. It is assumed that the bulk glasses and thin films have different elasticity levels due to the deformation of specific chemical bonds
Keywords :
chalcogenide glasses; elastic moduli; germanium compounds; microhardness; semiconductor thin films; voids (solid); GexSb40-xS60; GeSbS; bulk glass; chemical bonding; deformation; formation energy; microhardness; microvoid volume; module of elasticity; thin film; Glass; Physics; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 1996., International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-3223-7
Type :
conf
DOI :
10.1109/SMICND.1996.557399
Filename :
557399
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2121828
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