• DocumentCode
    2121922
  • Title

    Scheduling setup changes at bottleneck facilities in semiconductor manufacturing

  • Author

    Duwwayri, Z. ; Mollaghasemi, Mansooreh

  • Author_Institution
    i2 Technol., Irving, TX, USA
  • Volume
    2
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1208
  • Abstract
    In this paper, a scheduling heuristic was developed to aid the operators in semiconductor fabs in choosing what type of lots to process next on bottleneck facilities and whether to change machine setup in order to reduce cycle time. The scheduling heuristic aims at balancing workload levels for implanters processing lots at different stages of the wafer production lifecycle. This is accomplished by processing lots that contribute most to increasing inventory levels at the bottleneck facility. A whole production line simulation model was used to evaluate the performance of the scheduling heuristic and to compare it against several commonly used scheduling heuristics with respect to mean cycle time, work in process (WIP), and standard deviation of cycle time. Simulation results showed that the heuristic performed better than all other rules in terms of mean cycle time and WIP in all cases, and better in terms of standard deviation of cycle time for most cases tested
  • Keywords
    integrated circuit manufacture; ion implantation; production control; production engineering computing; semiconductor process modelling; bottleneck facilities; cycle time; implanter processing; inventory levels; ion implantation; production line simulation model; reentrant flow; scheduling heuristic; scheduling setup changes; semiconductor manufacturing; standard deviation of cycle time; wafer production lifecycle; work in process; workload level balancing; Dispatching; Engineering management; Fabrication; Industrial engineering; Job shop scheduling; Monitoring; Production; Semiconductor device doping; Semiconductor device manufacture; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2001. Proceedings of the Winter
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-7803-7307-3
  • Type

    conf

  • DOI
    10.1109/WSC.2001.977435
  • Filename
    977435