DocumentCode :
2122230
Title :
Test-driven development of consumer electronics device drivers: A user-level device driver approach
Author :
Seehwan Yoo ; Young-Pil Kim
Author_Institution :
Dankook Univ., Cheonan, South Korea
fYear :
2015
fDate :
9-12 Jan. 2015
Firstpage :
392
Lastpage :
394
Abstract :
Developing device drivers is important for innovative consumer electronics because device driver implements key functionalities of new devices. This paper suggests a test-driven development (TDD) of device drivers, taking advantage of user-level driver. Applying TDD to device drivers is difficult because usually device drivers are implemented inside kernel, and are tightly coupled with complex kernel driver framework, which hinders driver developers from using TDD. Therefore, testing the device driver mostly focused on interaction with the rest of the kernel, rather than the device operations. Recent user-level device driver separates device drivers from the kernel. Thus, we can easily apply TDD on device drivers, circumventing complex kernel operations, and focusing on device operations. In addition, we can effectively enlarge testing coverage, enhancing software quality.
Keywords :
consumer electronics; device drivers; operating system kernels; program testing; TDD; complex kernel driver framework; complex kernel operations; consumer electronics device drivers; device operations; innovative consumer electronics; software quality; test-driven development; user-level device driver approach; user-level driver; Consumer electronics; Hardware; Kernel; Performance evaluation; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Consumer Electronics (ICCE), 2015 IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4799-7542-6
Type :
conf
DOI :
10.1109/ICCE.2015.7066459
Filename :
7066459
Link To Document :
بازگشت