Title :
A 1.65W fully integrated 90nm Bulk CMOS Intrinsic Charge Recycling capacitive DC-DC converter: Design & techniques for high power density
Author :
Meyvaert, Hans ; Van Breussegem, Tom ; Steyaert, Michiel
Author_Institution :
ESAT-MICAS, Katholieke Univ. Leuven, Heverlee, Belgium
Abstract :
A fully integrated high power density capacitive 2:1 step-down DC-DC converter is designed in a standard Bulk CMOS technology. The implemented converter can deliver a maximum output power of 1.65W on a chip area of 2.14mm2, resulting in a power conversion density of 0.77W/mm2. Besides the primary goal of high power density a peak power conversion efficiency of 69% is achieved. This for a voltage step-down conversion from twice the nominal supply voltage of a 90nm technology (2Vdd = 2.4V) to 1V. Both the design as the implementation techniques to achieve the resulting power density, are discussed.
Keywords :
CMOS integrated circuits; DC-DC power convertors; charge recycling capacitive DC-DC converter; efficiency 69 percent; fully integrated Bulk CMOS intrinsic converter; fully integrated high power density capacitive step-down DC-DC converter; maximum output power; nominal supply voltage; peak power conversion efficiency; power 1.65 W; power conversion density; size 90 nm; voltage 1 V; voltage 2 V; voltage 2.4 V; voltage step-down conversion; CMOS integrated circuits; Capacitance; Capacitors; Charge transfer; Impedance; Transistors; Voltage control;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2011 IEEE
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4577-0542-7
DOI :
10.1109/ECCE.2011.6064205