• DocumentCode
    2122539
  • Title

    A methodology for excitation systems identification

  • Author

    Castro, Héctor Antonio Botero ; Scarpetta, José Miguel Ramírez

  • Author_Institution
    Dept. of Electr. Eng., Universidad Nacional de Colombia
  • fYear
    0
  • fDate
    0-0 0
  • Lastpage
    6
  • Abstract
    In this paper a methodology for parameter identification of the IEEE standard 421.5 (1992) excitation systems models is presented. The methodology applies parametric identification techniques to the linear dynamics of voltage regulator models. A pseudorandom binary sequence small signal is used in an offline generator test, that allows a reduction in the equipment test time, in comparison with step or frequency response methods. The remaining parameters for the saturation nonlinearities and exciter magnetic saturation are obtained by means of large signal excursion simple tests. The methodology is illustrated applying it to the IEEE ST1A model in simulation, and experimentally to a direct digital auto excited excitation system, represented with the IEEE ST4B model. Simulation and experimental results show the validity of the proposed methodology, with achieved successes percentages of 96% for simulation and 73% for experimentation
  • Keywords
    binary sequences; control nonlinearities; exciters; frequency response; power system parameter estimation; random sequences; voltage regulators; excitation systems identification; exciter magnetic saturation; frequency response methods; offline generator test; parameter identification; pseudorandom binary sequence small signal; saturation nonlinearities; voltage regulator models; Atmospheric modeling; Parameter estimation; Power system dynamics; Power system interconnection; Power system modeling; Power system reliability; Power system simulation; Regulators; System identification; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Control Applications, 2005. ICIECA 2005. International Conference on
  • Conference_Location
    Quito
  • Print_ISBN
    0-7803-9419-4
  • Type

    conf

  • DOI
    10.1109/ICIECA.2005.1644350
  • Filename
    1644350