• DocumentCode
    2122803
  • Title

    Measuring of dielectric properties by microstrip resonators in the GHz frequency

  • Author

    Rovensky, Tibor ; Pietrikova, Alena ; Vehec, Igor ; Kmec, Martin

  • Author_Institution
    Department of Technologies in Electronics, Technical University of Kosice, Slovak Republic
  • fYear
    2015
  • fDate
    6-10 May 2015
  • Firstpage
    192
  • Lastpage
    196
  • Abstract
    This paper presents analysis of four different (Rogers RO3003C, Rogers RO4403C, Rogers RT/duroid 5880, Rogers RT/duroid RO6010LM) Printed Circuit Boards (PCB) from the dielectric properties point of view in High Frequency (HF) area. Measuring of dielectric properties is provided by ring resonator and T-resonator. Both resonators are designed by self-created software tool and these microstrip structures are applied on PCB by common etching process. Microstrip resonators are designed to provide numerous data points over a broad frequency range. Fabricated resonators are measured by combination of Vector Network Analyser (VNA) and test probe station. Measured scattering parameters are used as input parameters for calculating dielectric constant and Q factor of measured dielectric substrate. Determined dielectric properties are plotted in graphs in frequency range from 1 GHz to 10 GHz.
  • Keywords
    Dielectric constant; Dielectric measurement; Frequency measurement; Q-factor; Resonant frequency; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2015 38th International Spring Seminar on
  • Conference_Location
    Eger, Hungary
  • Type

    conf

  • DOI
    10.1109/ISSE.2015.7247988
  • Filename
    7247988