DocumentCode
2122803
Title
Measuring of dielectric properties by microstrip resonators in the GHz frequency
Author
Rovensky, Tibor ; Pietrikova, Alena ; Vehec, Igor ; Kmec, Martin
Author_Institution
Department of Technologies in Electronics, Technical University of Kosice, Slovak Republic
fYear
2015
fDate
6-10 May 2015
Firstpage
192
Lastpage
196
Abstract
This paper presents analysis of four different (Rogers RO3003C, Rogers RO4403C, Rogers RT/duroid 5880, Rogers RT/duroid RO6010LM) Printed Circuit Boards (PCB) from the dielectric properties point of view in High Frequency (HF) area. Measuring of dielectric properties is provided by ring resonator and T-resonator. Both resonators are designed by self-created software tool and these microstrip structures are applied on PCB by common etching process. Microstrip resonators are designed to provide numerous data points over a broad frequency range. Fabricated resonators are measured by combination of Vector Network Analyser (VNA) and test probe station. Measured scattering parameters are used as input parameters for calculating dielectric constant and Q factor of measured dielectric substrate. Determined dielectric properties are plotted in graphs in frequency range from 1 GHz to 10 GHz.
Keywords
Dielectric constant; Dielectric measurement; Frequency measurement; Q-factor; Resonant frequency; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology (ISSE), 2015 38th International Spring Seminar on
Conference_Location
Eger, Hungary
Type
conf
DOI
10.1109/ISSE.2015.7247988
Filename
7247988
Link To Document