Title :
Enhanced face recognition using Cross Local Radon Binary Patterns
Author :
Chalamala, Srinivasa Rao ; Jami, Santosh Kumar ; Yegnanarayana, B.
Author_Institution :
TCS Innovation Labs., TATA Consultancy Services, Hyderabad, India
Abstract :
In this paper we introduce a novel face representation method called Cross Local Binary Patterns(XLBP) to improve the robustness of face recognition for partially occluded and non-uniformly illuminated face images. In our method we use Radon transform to capture the coarse level shape information and XLBP to capture the texture information. Individual histograms computed on each sub-block of the face image and are concatenated in spatial pyramid fashion to get the complete face descriptor. Distance measures based on Pyramid Matching Kernel(PMK) is used to match these face descriptors. Experiments on FERET and YaleB databases show the significance of this method.
Keywords :
Radon transforms; face recognition; image matching; image representation; image texture; pattern classification; shape recognition; visual databases; PMK; Radon transform; XLBP; YaleB databases; coarse level shape information; cross local radon binary patterns; enhanced face recognition; face descriptor; face representation method; illuminated face images; individual histograms; pyramid matching Kernel; spatial pyramid fashion; texture information; Databases; Face; Face recognition; Histograms; Lighting; Shape; Transforms; Bhattacharya distance; Pyramid Matching Kernel; Radon Transform; Spatial Pyramid; XLBP; XLRBP;
Conference_Titel :
Consumer Electronics (ICCE), 2015 IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4799-7542-6
DOI :
10.1109/ICCE.2015.7066492