Title :
Sensitivity of point defects in one dimensional nanocircuits
Author :
Hunt, Steven R. ; Hoang, Phuc D. ; Khalap, Vaikunth R. ; Wan, Danny ; Corso, Brad L. ; Collins, Philip G.
Author_Institution :
Dept. of Phys. & Astron., Univ. of California at Irvine, Irvine, CA, USA
Abstract :
When tailored to contain a single resistive defect, one dimensional nanocircuits can realize high dynamic range, high bandwidth transduction of single molecule chemical events. The physical mechanisms behind this sensitive transduction, however, remain poorly understood. Here, we complement ongoing sensing measurements with scanning probe characterization of the electronic properties of defects. The high sensitivity of defect sites is directly probed, and is found to be in excellent agreement with a finite element model containing realistic device parameters for the defect sites. The model illuminates the most likely sensing mechanisms of these single molecule circuits, and fully supports the premise that further tailoring of the defect sites could enable the chemically selective interrogation of a wide range of complex molecular interactions.
Keywords :
chemical sensors; finite element analysis; molecular electronics; nanoelectronics; point defects; sensitivity analysis; bandwidth transduction; electronic property; finite element model; molecular interactions; one dimensional nanocircuits; point defect sensitvity; scanning probe characterization; sensing measurements; single molecule chemical events; single molecule circuits; single resistive defect;
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2010.5690224