Physical modeling of linearity errors for the diagnosis of high resolution R-2R D/A converters

Author

Boni, A. ; Chiorboli, G. ; Franco, G. ; Mazzoleni, S. ; Ostacoli, M.

Author_Institution

Dipartimento Ing. Inf., Parma Univ., Italy

fYear

1994

fDate

28 Feb-3 Mar 1994

Firstpage

664

Abstract

A reduced physical model of the integral non-linearity error in high resolution R-2R D/A converters is obtained by circuit analysis and application of the ambiguity algorithm. Field experiments demonstrate that functional test programs based on this model achieve shorter test times and lower prediction errors than those based on larger models obtained by straight QR factorization

Keywords

characteristics measurement; circuit analysis computing; digital-analogue conversion; equivalent circuits; error analysis; ladder networks; linear systems; sensitivity analysis; QR factorization; ambiguity algorithm; circuit analysis; field experiments; functional test programs; high resolution R-2R D/A converters; integral nonlinearity error; linear error modelling; linearity errors; physical model; prediction errors; sensitivity analysis; test times; Circuit analysis; Circuit testing; Inspection; Linearity; Optical interconnections; Optical sensors; Optical switches; Packaging; Predictive models; Sensitivity analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.

Conference_Location

Paris

Print_ISBN

0-8186-5410-4

Type

conf

DOI

10.1109/EDTC.1994.326799

Filename

326799