DocumentCode
2123172
Title
Parametric identification using multilayer perceptron
Author
López, Jesús A. ; Caicedo, Eduardo
Author_Institution
Escuela de Ingenieria Electr. y Electron., Universidad del Valle, Cali
fYear
0
fDate
0-0 0
Lastpage
4
Abstract
In this work, we present an algorithm to extract a parametric model from a multi layer perceptron (MLP). The MLP is trained with input-output data collected from a process. This algorithm takes and processes the weights of the MLP to obtain a parametric model in difference equation form. As a first approach we use the MLP as a linear regresser. Next, we propose a scheme to extract the parameters from a neural network with non-linear activation functions applying Bayesian training. Comparisons between our parametric models and those using the identification system method show that the obtained models are similar to the traditional ones
Keywords
Bayes methods; difference equations; multilayer perceptrons; parameter estimation; regression analysis; Bayesian training; difference equation; identification system; linear regresser; multilayer perceptron; neural network; nonlinear activation functions; parametric identification; Bayesian methods; Data mining; Delay; Difference equations; Multilayer perceptrons; Neural networks; Parametric statistics; Predictive models; South America; System identification;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Control Applications, 2005. ICIECA 2005. International Conference on
Conference_Location
Quito
Print_ISBN
0-7803-9419-4
Type
conf
DOI
10.1109/ICIECA.2005.1644375
Filename
1644375
Link To Document