• DocumentCode
    2123172
  • Title

    Parametric identification using multilayer perceptron

  • Author

    López, Jesús A. ; Caicedo, Eduardo

  • Author_Institution
    Escuela de Ingenieria Electr. y Electron., Universidad del Valle, Cali
  • fYear
    0
  • fDate
    0-0 0
  • Lastpage
    4
  • Abstract
    In this work, we present an algorithm to extract a parametric model from a multi layer perceptron (MLP). The MLP is trained with input-output data collected from a process. This algorithm takes and processes the weights of the MLP to obtain a parametric model in difference equation form. As a first approach we use the MLP as a linear regresser. Next, we propose a scheme to extract the parameters from a neural network with non-linear activation functions applying Bayesian training. Comparisons between our parametric models and those using the identification system method show that the obtained models are similar to the traditional ones
  • Keywords
    Bayes methods; difference equations; multilayer perceptrons; parameter estimation; regression analysis; Bayesian training; difference equation; identification system; linear regresser; multilayer perceptron; neural network; nonlinear activation functions; parametric identification; Bayesian methods; Data mining; Delay; Difference equations; Multilayer perceptrons; Neural networks; Parametric statistics; Predictive models; South America; System identification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Control Applications, 2005. ICIECA 2005. International Conference on
  • Conference_Location
    Quito
  • Print_ISBN
    0-7803-9419-4
  • Type

    conf

  • DOI
    10.1109/ICIECA.2005.1644375
  • Filename
    1644375