Title :
Design of a real time geometric classifier
Author :
Robert, M. ; Gorria, P. ; Mitéran, J. ; Turgis, S.
Author_Institution :
Univ. Montpellier II, France
fDate :
28 Feb-3 Mar 1994
Abstract :
Summary form only given. The authors present the design of a real time parallel processor for classification adapted to image processing. They propose a geometric classification method allowing the use of a large number of parameters and ensuring a high decision speed. In their classification approach, two phases have to be considered: the training phase, which partitions the attribute space in characterizable regions by using a set of upper and lower limits (hypercube), hence, this set of limits defines a stress polytope, such that all the points of a polytope belong to the same class; and the decision phase, which compares an attribute vector to a set of lower and upper limits, that is, the polytope limits. These comparisons are made in parallel and in a synchronous way on every limit, every polytope and every parameter in one clock cycle. This classification operator has been integrated in the form of a full custom circuit developed in a CMOS 1.2 μm process (area 29 mm2). This powerful processor ia able to classify a point in less than 100ns. A comparison with a standard cell and an FPGA implementation (Xilinx XC4005) is made : it is shown that taking into account the reprogramming facilities of the SRAM based FPGAs, it is possible to implement a flexible reconfigurable classifier in a field programmable gate array
Keywords :
CMOS integrated circuits; application specific integrated circuits; digital signal processing chips; image recognition; logic arrays; parallel algorithms; parallel architectures; real-time systems; 1.2 micron; CMOS process; DSP chip; FPGA implementation; SRAM based FPGA; attribute vector; decision phase; field programmable gate array; full custom circuit; geometric classification method; hypercube; image processing; parallel processor; real time geometric classifier; stress polytope; training phase; Application specific integrated circuits; CMOS process; Clocks; Field programmable gate arrays; Hypercubes; Image edge detection; Image processing; Random access memory; Stress;
Conference_Titel :
European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-5410-4
DOI :
10.1109/EDTC.1994.326806