Title :
Efficient implementations of self-checking multiply and divide arrays
Author :
Nicolaidis, M. ; Bederr, H.
Author_Institution :
Reliable Integrated Syst. Group, Grenoble, France
fDate :
28 Feb-3 Mar 1994
Abstract :
In this paper we present efficient self checking implementations for multiply and divide arrays. These implementations are strongly fault secure or totally self-checking for a comprehensive fault model which includes stuck-at, stuck-on and stuck-open faults. They are compatible with data paths checked by the parity code (i.e. no code translators are needed), so that the self checking implementation of the whole data path is simplified
Keywords :
carry logic; circuit reliability; digital arithmetic; dividing circuits; logic arrays; logic testing; multiplying circuits; ALU; adder cells; arithmetic units; carry save array multiplier; comprehensive fault model; data paths; fault security; multiply and divide arrays; parity code; self checking implementations; stuck-at faults; stuck-on faults; stuck-open faults; Adders; Circuit faults; Digital arithmetic; Encoding; Fault tolerant systems; Hardware; Logic circuits; Positron emission tomography; Rails; Registers;
Conference_Titel :
European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-5410-4
DOI :
10.1109/EDTC.1994.326816
