An efficient yield optimization method using a two step linear approximation of circuit performance

Author

Wang, Zhihua ; Director, S.W.

Author_Institution

Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

fYear

1994

fDate

28 Feb-3 Mar 1994

Firstpage

567

Lastpage

571

Abstract

A novel method for the estimation of yield of integrated circuits based on a two step linear approximation of circuit performance is proposed. By using this method, only one complete circuit simulation is needed for the estimation of yield. A new algorithm for yield optimization is also presented. It is based on the random direction stochastic approximation and does not require the evaluation of yield gradients. Examples are given to demonstrate the efficiency of the algorithm

Keywords

Monte Carlo methods; VLSI; circuit analysis computing; differential amplifiers; linear integrated circuits; operational amplifiers; optimisation; Monte Carlo analysis; VLSI circuit; algorithm; bipolar differential amplifier; circuit simulation; integrated circuit yield; linear transconductance amplifier; parametric yield; random direction stochastic approximation; two step linear approximation; yield optimization method; Circuit optimization; Design optimization; Equations; Gravity; Integrated circuit yield; Linear approximation; Optimization methods; Very large scale integration; Voltage; Yield estimation;

fLanguage

English

Publisher

ieee

Conference_Titel

European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.

Conference_Location

Paris

Print_ISBN

0-8186-5410-4

Type

conf

DOI

10.1109/EDTC.1994.326817

Filename

326817