Title :
Variable accuracy device modeling for event-driven circuit simulation
Author :
Michaels, Kimon W. ; Strojwas, Andrzej J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
28 Feb-3 Mar 1994
Abstract :
This paper presents a complete variable accuracy device modeling methodology which varies the error tolerances and device model accuracy during the simulation based upon the dynamic state of operation of the circuit and the circuit topology. The number of device model evaluations required and the average device model evaluation time are minimized
Keywords :
SPICE; circuit analysis computing; discrete event simulation; network topology; semiconductor device models; BJT; BSIM model; MOSFET; SPICE level 1 model; circuit dynamic operation state; circuit topology; device model accuracy; error tolerance; event-driven circuit simulation; maximum required model complexity; timing error; variable accuracy device modeling methodology; Circuit simulation; Circuit topology; Computational modeling; Computer errors; Computer simulation; Discrete event simulation; Error analysis; Surfaces; Timing; Transient analysis;
Conference_Titel :
European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-5410-4
DOI :
10.1109/EDTC.1994.326819
