• DocumentCode
    2123678
  • Title

    Long term sustainability of differentially reliable systems in the dark silicon era

  • Author

    Allred, Jason M. ; Roy, Sandip ; Chakraborty, Koushik

  • Author_Institution
    BRIDGE Lab., Utah State Univ., Logan, UT, USA
  • fYear
    2013
  • fDate
    6-9 Oct. 2013
  • Firstpage
    70
  • Lastpage
    77
  • Abstract
    As transistor miniaturization continues, providing robustness and computational correctness comes with rising power, performance, and area overhead costs. However, the diversity of software error tolerance is increasing as modern society embraces ubiquitous computing. This diversity can be exploited by differentially reliable (DR) multicore systems. The rising level of dark silicon-the portion of a chip that must remain inactive due to power budget constraints-makes such DR systems even more attractive when compared to homogeneous designs because power efficiency is improved with the increased flexibility of dynamically selecting appropriate cores for a given software workload. However, ensuring the long-term sustainability of these DR systems is a profound challenge. Asymmetric utilization of cores, differential aging degradation, and manufacturing process variation alter the relative reliability of DR system components, degrading and even eliminating the energy efficiency advantage. In this paper, we propose a feedback control based thread-to-core mapping framework to ensure longterm sustainability and extend the energy efficiency of a DR system. Over a ten-year lifespan, we analyze our approach on two DR design techniques and respectively demonstrate 14.4-16.3% and 26.1-31.0% in sustained energy-efficiency benefits, surpassing the recently proposed race-to-idle approach.
  • Keywords
    energy conservation; multiprocessing systems; power aware computing; sustainable development; DR design techniques; DR multicore systems; asymmetric core utilization; differential aging degradation; differentially reliable multicore systems; energy efficiency; energy efficiency advantage; feedback control based thread-to-core mapping framework; long term sustainability; manufacturing process variation; power budget constraints; power efficiency; race-to-idle approach; software error tolerance diversity; software workload; transistor miniaturization; ubiquitous computing; Aging; Integrated circuit reliability; Reliability engineering; Silicon; Software; Software reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design (ICCD), 2013 IEEE 31st International Conference on
  • Conference_Location
    Asheville, NC
  • Type

    conf

  • DOI
    10.1109/ICCD.2013.6657027
  • Filename
    6657027