Title :
Effect of Scalability on Nonlinear MESFET Model Accuracy
Author :
Tellez, J Rodriguez ; Mezher, K.A.
Author_Institution :
Dept of Electronic and Electrical Engineering, University of Bradford, UK
Keywords :
Capacitance; Frequency measurement; Gallium arsenide; MESFETs; Scalability; Scattering parameters; Size measurement; Sun; Topology; Workstations;
Conference_Titel :
Microwave Conference, 1994. 24th European
Conference_Location :
Cannes, France
DOI :
10.1109/EUMA.1994.337452
