Effect of Scalability on Nonlinear MESFET Model Accuracy

Author

Tellez, J Rodriguez ; Mezher, K.A.

Author_Institution

Dept of Electronic and Electrical Engineering, University of Bradford, UK

Volume

fYear

1994

fDate

5-9 Sept. 1994

Firstpage

1632

Lastpage

1637

Keywords

Capacitance; Frequency measurement; Gallium arsenide; MESFETs; Scalability; Scattering parameters; Size measurement; Sun; Topology; Workstations;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 1994. 24th European

Conference_Location

Cannes, France

Type

DOI

10.1109/EUMA.1994.337452

Filename

4138498

Link To Document