• DocumentCode
    2123907
  • Title

    Effect of SiO2 additive as inhibitor on crystalline structure and H2S sensing performance of CuO-Au-SnO2 thin film prepared by liquid phase deposition

  • Author

    Chiou, Jin-Chern ; Tsai, Shang-Wei ; Huang, Cheng-Tang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    1-4 Nov. 2010
  • Firstpage
    333
  • Lastpage
    336
  • Abstract
    In situ SiO2-doped SnO2 thin films have been prepared by liquid phase deposition method. The effect of SiO2 additive on the surface morphology and crystalline structural of the thin films were investigated by grazing incident angle X-ray diffraction (GIAXRD) and scanning electron microscopy (SEM). In the characteristics of sensing response, the SiO2-doped CuO Au-SnO2 gas sensors (Si/Sn = 0.25 and 0.33) have greater sensitivity and shorter response time than CuO-Au-SnO2 gas sensor. However, the doped CuO-Au-SnO2 gas sensors (Si/Sn = 0.33) can obtained better sensitivity (S = 67 for 2ppm) and response time (t90% <; 3 s).
  • Keywords
    copper compounds; gas sensors; gold; liquid phase deposited coatings; silicon compounds; surface morphology; tin compounds; CuO-Au-SnO2:SiO2; GIAXRD; H2S; SEM; crystalline structure; gas sensor; grazing incident angle X-ray diffraction; inhibitor; liquid phase deposition method; scanning electron microscopy; surface morphology; thin film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2010 IEEE
  • Conference_Location
    Kona, HI
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-8170-5
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2010.5690256
  • Filename
    5690256