DocumentCode :
2123907
Title :
Effect of SiO2 additive as inhibitor on crystalline structure and H2S sensing performance of CuO-Au-SnO2 thin film prepared by liquid phase deposition
Author :
Chiou, Jin-Chern ; Tsai, Shang-Wei ; Huang, Cheng-Tang
Author_Institution :
Dept. of Electr. Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
333
Lastpage :
336
Abstract :
In situ SiO2-doped SnO2 thin films have been prepared by liquid phase deposition method. The effect of SiO2 additive on the surface morphology and crystalline structural of the thin films were investigated by grazing incident angle X-ray diffraction (GIAXRD) and scanning electron microscopy (SEM). In the characteristics of sensing response, the SiO2-doped CuO Au-SnO2 gas sensors (Si/Sn = 0.25 and 0.33) have greater sensitivity and shorter response time than CuO-Au-SnO2 gas sensor. However, the doped CuO-Au-SnO2 gas sensors (Si/Sn = 0.33) can obtained better sensitivity (S = 67 for 2ppm) and response time (t90% <; 3 s).
Keywords :
copper compounds; gas sensors; gold; liquid phase deposited coatings; silicon compounds; surface morphology; tin compounds; CuO-Au-SnO2:SiO2; GIAXRD; H2S; SEM; crystalline structure; gas sensor; grazing incident angle X-ray diffraction; inhibitor; liquid phase deposition method; scanning electron microscopy; surface morphology; thin film;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
ISSN :
1930-0395
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2010.5690256
Filename :
5690256
Link To Document :
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