Title :
A 0.5 watt-40% PAE InP double heterojunction bipolar transistor K-band MMIC power amplifier
Author :
Kobayashi, K.W. ; Oki, A.K. ; Yang, Li-W ; Gutierrez-Aitken, A. ; Chin, P. ; Sawdai, Don ; Okamura, W. ; Lester, J. ; Kaneshiro, E. ; Gorssman, P.C. ; Sato, K. ; Block, T.R. ; Yen, H.C. ; Streit, D.C.
Author_Institution :
TRW Electron., Redondo Beach, CA, USA
Abstract :
We report on the first InP DHBT K-band fully integrated power amplifier which achieves 0.5 Watts of output power and 40% power added efficiency (PAE). The power DHBTs obtain a BVceo >18 V and an fT and fmax of 80 GHz and 160 GHz, respectively. The MMIC amplifier combines eight 1.5×30 μm2 emitter fingers for a total periphery of 360 μm2. At 21 GHz the MMIC power amplifier achieves a linear gain of 9.4 dB, output power of 27 dBm with a 40% PAE. The amplifier was operated under a Vce=5.5V and Jc=54 KA/cm 2 and obtained a corresponding power density of 1.4 mW/μm 2. To our knowledge this is the highest output power obtained for a fully monolithic-50-Ω-matched MMIC power amplifier based on InP HBT technology
Keywords :
III-V semiconductors; MMIC power amplifiers; bipolar MIMIC; bipolar MMIC; heterojunction bipolar transistors; indium compounds; integrated circuit measurement; millimetre wave measurement; millimetre wave power amplifiers; power bipolar transistors; 0.5 W; 1.5 mum; 160 GHz; 18 V; 21 GHz; 30 mum; 40 percent; 5.5 V; 50 ohm; 80 GHz; 9.4 dB; InP; InP DHBT K-band fully integrated power amplifier; InP HBT technology; InP double heterojunction bipolar transistor K-band MMIC power amplifier; MMIC amplifier; MMIC power amplifier; emitter fingers; linear gain; monolithic-50-Ω-matched MMIC power amplifier; output power; power DHBTs; power added efficiency; power density; Double heterojunction bipolar transistors; Fingers; Gain; Heterojunction bipolar transistors; High power amplifiers; Indium phosphide; K-band; MMICs; Power amplifiers; Power generation;
Conference_Titel :
Indium Phosphide and Related Materials, 2000. Conference Proceedings. 2000 International Conference on
Conference_Location :
Williamsburg, VA
Print_ISBN :
0-7803-6320-5
DOI :
10.1109/ICIPRM.2000.850279