DocumentCode
2124014
Title
Can you deliver the semiconductor devices after performing periodic tests?
Author
Dragan, Maria ; Bazu, Marius
Author_Institution
Res. Inst. for Electron. Components (ICCE), Bucharest, Romania
Volume
2
fYear
1996
fDate
9-12 Oct 1996
Firstpage
443
Abstract
A method to detect the character of a periodic test, destructive or nondestructive, was developed. This method allows the delivery of those semiconductor devices which undergo nondestructive periodic tests. Beneficial effects for the device manufacturers are obvious
Keywords
nondestructive testing; probability; production testing; semiconductor device manufacture; semiconductor device testing; NDT character determination; nondestructive tests; periodic tests; semiconductor devices; Diodes; Nondestructive testing; Performance evaluation; Production; Resistance heating; Semiconductor device testing; Semiconductor devices; Soldering; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 1996., International
Conference_Location
Sinaia
Print_ISBN
0-7803-3223-7
Type
conf
DOI
10.1109/SMICND.1996.557415
Filename
557415
Link To Document