DocumentCode
2124711
Title
Hair segmentation and counting algorithms in microscopy image
Author
Huang-Chia Shih ; Bo-Syun Lin
Author_Institution
Dept. of Electr. Eng., Yuan Ze Univ., Chungli, Taiwan
fYear
2015
fDate
9-12 Jan. 2015
Firstpage
612
Lastpage
613
Abstract
One emerging subject in medical image processing is to quantitatively assess the health and the properties of cranial hairs, including density, diameter, length, level of oiliness, and others. This information helps hair specialists with making a more accurate diagnosis and the therapy required. Unfortunately, present hair care and scalp diagnosis systems lack both robustness and efficiency. Hair counting is usually done manually, producing results that are often unreliable. To solve this problem, we developed a practical hair counting algorithm. This analytic system calculates the number of hairs on a scalp using an unsupervised mechanism, providing accurate information for both the hair specialist and the patient. Our proposed hair counting algorithm is substantially more accurate than the Hough-based one, and is robust to curls, oily scalp, noise-corruption, and overlapping hairs, under various levels of illumination.
Keywords
biomedical optical imaging; feature extraction; image segmentation; medical image processing; noise; patient care; patient treatment; Hough-based algorithm; analytic system; cranial hair density; cranial hair diameter; cranial hair health assessment; cranial hair length; cranial hair oiliness level; cranial hair property assessment; curls; efficiency; hair care; hair counting algorithm; hair number calculation; hair segmentation; hair specialist; illumination level variation; manual hair counting; medical image processing; microscopy image; noise-corruption; oily scalp; overlapping hair; quantitative hair assessment; robustness; scalp diagnosis system; therapy; unsupervised mechanism; Hair; Image color analysis; Image segmentation; Labeling; Lighting; Microscopy; Scalp;
fLanguage
English
Publisher
ieee
Conference_Titel
Consumer Electronics (ICCE), 2015 IEEE International Conference on
Conference_Location
Las Vegas, NV
Print_ISBN
978-1-4799-7542-6
Type
conf
DOI
10.1109/ICCE.2015.7066549
Filename
7066549
Link To Document