• DocumentCode
    2124833
  • Title

    Exponential Effective SIR metric for LTE downlink

  • Author

    Olmos, Joan ; Serra, Albert ; Ruiz, Silvia ; Garcia-Lozano, Mario ; Gonzalez, David

  • Author_Institution
    Signal Theor. & Commun. Dept., Univ. Politec. de Catalunya (UPC), Barcelona, Spain
  • fYear
    2009
  • fDate
    13-16 Sept. 2009
  • Firstpage
    900
  • Lastpage
    904
  • Abstract
    3GPP LTE is the evolution of UMTS which will make possible to deliver next generation high quality multimedia services according to the users´ expectations. The flexibility of the downlink OFDM radio interface with Adaptive Modulation and Coding (AMC), MIMO and H-ARQ plays a crucial role in achieving the low latency and high spectral efficiency promised by the new radio access standard. This paper presents a LTE DL link level simulator whose main purpose is to generate suitable look-up tables to interface with a system level simulator. In this context, the Exponential Effective SIR (EESIR) metric is a link abstraction model that is used to properly characterize multistate channels. The reference BLER curves in AWGN channel and the parameters of the EESIR model are given for the complete list of CQI´s specified for LTE DL. The obtained results also include curves of mean link level throughput for different AMC formats and MIMO configurations.
  • Keywords
    3G mobile communication; AWGN channels; adaptive modulation; 3GPP LTE; AWGN channel; LTE downlink; OFDM radio interface; SIR metric; UMTS; adaptive modulation and coding; link abstraction model; next generation high quality multimedia services; 3G mobile communication; AWGN channels; Bandwidth; Downlink; MIMO; Modulation coding; OFDM modulation; Physical layer; Redundancy; Throughput; 3GPP Long Term Evolution; Exponential Effective SIR; Link level simulator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Personal, Indoor and Mobile Radio Communications, 2009 IEEE 20th International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    978-1-4244-5122-7
  • Electronic_ISBN
    978-1-4244-5123-4
  • Type

    conf

  • DOI
    10.1109/PIMRC.2009.5449772
  • Filename
    5449772