Title :
On-line condition monitoring for MOSFET and IGBT switches in digitally controlled drives
Author :
Anderson, Jason M. ; Cox, Robert W.
Author_Institution :
Dept. of Electr. & Comput. Eng., UNC, Charlotte, NC, USA
Abstract :
The early detection of incipient faults is desirable in mission-critical applications such as shipboard propulsion drives. This paper presents an on-line condition-monitoring approach for detecting incipient faults in IGBTs and MOSFETs. The proposed algorithm extracts important device features (i.e VCE,ON and RDS,ON) and compares them to healthy values recorded over a range of operating conditions. The algorithm is based on principal-components analysis (PCA). An experimental implementation in an IGBT-based drive is described. An on-line feature extraction scheme for MOSFETs is also proposed and demonstrated. This scheme exploits the nature of carrier-based PWM in order simplify the measurement process.
Keywords :
MOSFET; condition monitoring; digital control; power semiconductor switches; principal component analysis; IGBT switches; MOSFET; PCA; carrier-based PWM; digital controlled drives; measurement process; mission-critical applications; on-line condition monitoring; on-line feature extraction scheme; principal-components analysis; shipboard propulsion drives; Current measurement; Feature extraction; Insulated gate bipolar transistors; Logic gates; Monitoring; Vectors; Voltage measurement;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2011 IEEE
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4577-0542-7
DOI :
10.1109/ECCE.2011.6064302