• DocumentCode
    2125411
  • Title

    Joint channel estimation and data detection for OFDM systems over doubly selective channels

  • Author

    He, Lanlan ; Ma, Shaodan ; Wu, Yik-Chung ; Ng, Tung-Sang

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
  • fYear
    2009
  • fDate
    13-16 Sept. 2009
  • Firstpage
    446
  • Lastpage
    450
  • Abstract
    In this paper, a joint channel estimation and data detection algorithm is proposed for OFDM systems under doubly selective channels (DSCs). After representing the DSC using Karhunen-Loe¿ve basis expansion model (K-L BEM), the proposed algorithm is developed based on the expectation-maximization (EM) algorithm. Basically, it is an iterative algorithm including two steps at each iteration. In the first step, the unknown coefficients in K-L BEM are first integrated out to obtain a function which only depends on data, and meanwhile, a maximum a posteriori (MAP) channel estimator is obtained. In the second step, data are directly detected by a novel approach based on the function obtained in the first step. Moreover, a Bayesian Cramer-Rao Lower Bound (BCRB) which is valid for any channel estimator is also derived to evaluate the performance of the proposed channel estimator. The effectiveness of the proposed algorithm is finally corroborated by simulation results.
  • Keywords
    OFDM modulation; channel estimation; expectation-maximisation algorithm; Bayesian Cramer-Rao lower bound; EM algorithm; Karhunen-Loe¿ve basis expansion model; MAP channel estimator; OFDM systems; data detection; doubly selective channels; expectation-maximization algorithm; iterative algorithm; maximum a posteriori channel estimator; Channel estimation; Data engineering; Detection algorithms; Detectors; Helium; Intersymbol interference; Iterative algorithms; Multiaccess communication; OFDM; Time-varying channels;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Personal, Indoor and Mobile Radio Communications, 2009 IEEE 20th International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    978-1-4244-5122-7
  • Electronic_ISBN
    978-1-4244-5123-4
  • Type

    conf

  • DOI
    10.1109/PIMRC.2009.5449795
  • Filename
    5449795