DocumentCode
2125509
Title
Switched current sigma-delta A/D converter for a CMOS subscriber line analog front end
Author
Gevaert, Dorine ; Vanneuville, Jozef ; Nedved, Jiri ; Sevenhans, Jan
Author_Institution
Dept. of Microelectron., KIHWV-Oostende, Belgium
fYear
1994
fDate
28 Feb-3 Mar 1994
Firstpage
75
Lastpage
79
Abstract
This paper describes the design and testing of a 1-bit A/D converter based on the sigma-delta modulation principle. Unlike the conventional realisations using the switched capacitor approach, the current switching technique uses the current level as a variable. In order to check the feasibility and advantages of this technique, a first order 1-bit A/D converter and a second order 1-bit A/D converter were designed. In the first order 1-bit A/D converter a time-continuous current-integrator is used as filter. The circuit has been designed realised and tested. In the second order 1-bit A/D converter the filter is based on the analog sampling and processing of a current signal. The second order filter is implemented with class AB switched current memory cells. The design has been simulated and processed in ES2 1.5 μm CMOS technology
Keywords
CMOS integrated circuits; analogue processing circuits; analogue-digital conversion; delta modulation; integrating circuits; linear integrated circuits; switched networks; 1-bit A/D converter; CMOS subscriber line analog front end; ES2 1.5 μm CMOS technology; SI integrator; analog current signal processing; analog sampling; class AB switched current memory cells; current switching technique; first order ADC; power spectral density; second order ADC; sigma-delta modulation; switched current sigma-delta A/D converter; time-continuous current-integrator filter; CMOS process; CMOS technology; Capacitors; Circuit simulation; Circuit testing; Delta-sigma modulation; Filters; Signal processing; Signal sampling; Switching converters;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.
Conference_Location
Paris
Print_ISBN
0-8186-5410-4
Type
conf
DOI
10.1109/EDTC.1994.326895
Filename
326895
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