• DocumentCode
    2125509
  • Title

    Switched current sigma-delta A/D converter for a CMOS subscriber line analog front end

  • Author

    Gevaert, Dorine ; Vanneuville, Jozef ; Nedved, Jiri ; Sevenhans, Jan

  • Author_Institution
    Dept. of Microelectron., KIHWV-Oostende, Belgium
  • fYear
    1994
  • fDate
    28 Feb-3 Mar 1994
  • Firstpage
    75
  • Lastpage
    79
  • Abstract
    This paper describes the design and testing of a 1-bit A/D converter based on the sigma-delta modulation principle. Unlike the conventional realisations using the switched capacitor approach, the current switching technique uses the current level as a variable. In order to check the feasibility and advantages of this technique, a first order 1-bit A/D converter and a second order 1-bit A/D converter were designed. In the first order 1-bit A/D converter a time-continuous current-integrator is used as filter. The circuit has been designed realised and tested. In the second order 1-bit A/D converter the filter is based on the analog sampling and processing of a current signal. The second order filter is implemented with class AB switched current memory cells. The design has been simulated and processed in ES2 1.5 μm CMOS technology
  • Keywords
    CMOS integrated circuits; analogue processing circuits; analogue-digital conversion; delta modulation; integrating circuits; linear integrated circuits; switched networks; 1-bit A/D converter; CMOS subscriber line analog front end; ES2 1.5 μm CMOS technology; SI integrator; analog current signal processing; analog sampling; class AB switched current memory cells; current switching technique; first order ADC; power spectral density; second order ADC; sigma-delta modulation; switched current sigma-delta A/D converter; time-continuous current-integrator filter; CMOS process; CMOS technology; Capacitors; Circuit simulation; Circuit testing; Delta-sigma modulation; Filters; Signal processing; Signal sampling; Switching converters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-5410-4
  • Type

    conf

  • DOI
    10.1109/EDTC.1994.326895
  • Filename
    326895