Title :
Introduction to the Special Section
Author :
Ottavi, Marco ; Park, Nahea
Author_Institution :
University of Rome “Tor Vergata”, Department of Electronic Engineering, 00133 Rome, Italy
Abstract :
The five papers in this special section on defect and fault tolerance in VLSI and nanotechnology systems cover a wide spectrum of techniques, which are encountered in the design of defect and fault tolerance in nanoscale circuits and systems.
Keywords :
Aging; Circuit faults; Fault detection; Fault tolerance; Nanoscale devices; Special issues and sections;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2013.2262732
