DocumentCode :
2125653
Title :
CMOS-integrated stress sensor systems
Author :
Ruther, P. ; Baumann, M. ; Gieschke, P. ; Herrmann, M. ; Lemke, B. ; Seidl, K. ; Paul, O.
Author_Institution :
Dept. of Microsyst. Eng. (IMTEK), Univ. of Freiburg, Freiburg, Germany
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
2073
Lastpage :
2078
Abstract :
Sensor systems based on piezoresistors have found a wide variety of applications whenever mechanical stress due to external mechanical input is to be determined. Such sensor elements are fabricated using commercial CMOS processes enabling the realization of highly integrated systems with electronics for signal amplification and multiplexing. They combine stress-sensing elements such as Wheatstone bridges, 4- and 8-terminal well-based devices, or 4-contact piezoresistive field effect transistors, i.e. piezo-FETs. In addition, innovative devices generating out-of-plane current components are applied to determine out-of-plane stress components. The paper discusses the sensing elements, the system architecture and the post-CMOS fabrication processes required to realize the CMOS-integrated stress sensor systems. Smart orthodontic brackets and a stress sensing neural probe are discussed in more detail.
Keywords :
CMOS integrated circuits; field effect transistors; piezoresistive devices; sensors; CMOS-integrated stress sensor system; multiplexing; out-of-plane current component; out-of-plane stress component; piezoresistive field effect transistors; signal amplification; smart orthodontic bracket; stress sensing neural probe; wheatstone bridge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
ISSN :
1930-0395
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2010.5690329
Filename :
5690329
Link To Document :
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