Title :
A 0.9 V sense-amplifier driver for high-speed Gb-scale DRAMs
Author :
Gotoh, K. ; Ogawa, J. ; Saito, M. ; Tamura, H. ; Taguchi, M.
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
Abstract :
We proposed a new sense-amplifier driver for low power, high-speed Gb-scale DRAMs. Our sense amplifier is temporally isolated from the bit line and we use overdriving with boost capacitors, to operate at a Vcc of down to 0.8 V. A charge recycle technique using a new charge-transfer transistor driver is employed to reduce power consumption in the additional controlling circuits. SPICE simulation showed that the access time was 2.7 ns faster than the conventional method, and the power consumption to isolate the bit lines and overdrive the sense amplifier was reduced by 28% using the charge recycle technique.
Keywords :
DRAM chips; driver circuits; 0.9 V; SPICE simulation; bit line isolation; boost capacitor; charge recycle; charge-transfer transistor; low power high-speed gigabit-scale DRAM; overdrive; sense-amplifier driver; Capacitors; Circuit simulation; Driver circuits; Energy consumption; Power amplifiers; Recycling; SPICE;
Conference_Titel :
VLSI Circuits, 1996. Digest of Technical Papers., 1996 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-3339-X
DOI :
10.1109/VLSIC.1996.507733