DocumentCode :
2125973
Title :
Minimizing ROBDD size of incompletely specified multiple output functions
Author :
Chang, S.-C. ; Cheng, D.I. ; Marek-Sadowska, M.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fYear :
1994
fDate :
Feb. 28 1994-March 3 1994
Firstpage :
620
Lastpage :
624
Abstract :
The size of ROBDD is essential in many applications. In this paper we propose a heuristic that minimizes ROBDD size for incompletely specified multiple output functions. Our technique involves giving a new interpretation of ROBDDs with an extra variable, Z for incompletely specified functions. This new interpretation allows us to assign don´t cares to either the on-set or the off-set yielding an efficient minimization of ROBDD size. The extra variable Z carries the information of the don´t cares and preserves the flexibility of choosing the best cover for a given incompletely specified function. Starting from the top level of an ROBDD, we minimize greedily the number of nodes at every level by assigning as few don´t cares as possible to either the on-set or the off-set. We propagate the remaining unused don´t cares to lower levels of an ROBDD by moving the extra variable downwards. We performed three sets of experiments. The results are very encouraging.<>
Keywords :
Boolean functions; directed graphs; logic CAD; logic design; minimisation of switching nets; ROBDD size minimisation; directed acyclic graph; don´t cares; extra variable; heuristic; incompletely specified functions; incompletely specified multiple output functions; lower levels; off-set; on-set; reduced ordered binary decision diagram; top level; Application software; Appropriate technology; Boolean functions; Data structures; Decoding; Encoding; Field programmable gate arrays; Logic functions; Table lookup; Terminology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.
Conference_Location :
Paris, France
Print_ISBN :
0-8186-5410-4
Type :
conf
DOI :
10.1109/EDTC.1994.326921
Filename :
326921
Link To Document :
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