DocumentCode :
2126078
Title :
A deep sub-V, single power-supply SRAM cell with multi-V/sub T/, boosted storage node and dynamic load
Author :
Itoh, K. ; Fridi, A.R. ; Bellaouar, A. ; Elmasry, M.I.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fYear :
1996
fDate :
13-15 June 1996
Firstpage :
132
Lastpage :
133
Abstract :
The key issues in ultralow voltage SRAM design are a reduction in power supply voltage to a solar-cell voltage of 0.5V or less, single supply operation, and an increase in the cell voltage-margin. However, these problems remain largely unsolved. Even in most advanced cells an unavoidably high FET threshold voltage (V/sub T/) of the cell compared with the low stored node-voltage of supply restricts the supply to around 1V, although 0.5 V operation has been reported with no cell margin. Moreover, the negative pull down of the cell source line prevents single supply operation, since an on-chip negative voltage generator comprising charge pumping circuits never manages a heavy data-line capacitance. This paper describes an innovative circuit for overcoming these problems, demonstrating the feasibility of a single 0.3 V, 50 MHz, 0.25 /spl mu/m 8Kb SRAM. A multi-V/sub T/ cell, a boosted cell storage-node and a dynamic cell load contribute to the outstanding performance.
Keywords :
SRAM chips; VLSI; cellular arrays; integrated circuit design; memory architecture; 0.25 micron; 0.3 V; 50 MHz; 8 Kbit; SRAM cell; boosted storage node; cell source line; cell voltage-margin; dynamic load; multi-V/sub T/ cell; negative pull down; single power-supply; solar-cell voltage; ultralow voltage SRAM; Capacitance; Charge pumps; Circuits; FETs; Power supplies; Random access memory; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1996. Digest of Technical Papers., 1996 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-3339-X
Type :
conf
DOI :
10.1109/VLSIC.1996.507743
Filename :
507743
Link To Document :
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