Title :
Uncertainty analysis of a DVM-based quantum Hall measurement set-up
Author :
Rietveld, C. ; Van Mullem, C.J.
Author_Institution :
NMi Van Swinden Lab., Delft, Netherlands
Abstract :
A detailed uncertainty analysis is presented of a quantum Hall measurement set-up based on a digital voltmeter (DVM) that has been developed at the NMi Van Swinden Laboratorium. Special attention is paid to the uncertainty contributions that arise from the DVMs being used.
Keywords :
Digital voltmeters; Electric resistance measurement; Measurement standards; Measurement uncertainty; Quantum Hall effect; DVM-based setup; linear DVM; quantum Hall measurement setup; resistance measurement; resistance standards comparison; uncertainty analysis; Current measurement; Electrical resistance measurement; Hall effect; Instruments; Laboratories; Measurement standards; Relays; Resistors; Temperature; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.850891
