DocumentCode
2127204
Title
A new Bulk Built-In Current Sensing circuit for single-event transient detection
Author
Zhang, Zhichao ; Wang, Tao ; Chen, Li ; Yang, Jinsheng
Author_Institution
Electr. & Comput. Eng., Univ. of Saskatchewan, Saskatoon, SK, Canada
fYear
2010
fDate
2-5 May 2010
Firstpage
1
Lastpage
4
Abstract
This paper introduces a new design for the Bulk Built-In Current Sensor (BICS) capable of detecting the single-event transients (SET) due to a particle strike in the integrated circuits. An 4-bit multiplier is used as a case study. The simulation results indicate that efficiency and applicability of the Bulk-BICS of this work improves while the power consumption and area overhead reduce greatly.
Keywords
built-in self test; logic design; multiplying circuits; BICS; SET; bulk built-in current sensing circuit; bulk built-in current sensor; integrated circuits; multiplier circuit; single-event transient detection; Artificial neural networks; Latches; MOSFETs; Neodymium; Simulation; Transient analysis; area overhead; built-in current sensor; power consumption; single-event transient (SET);
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering (CCECE), 2010 23rd Canadian Conference on
Conference_Location
Calgary, AB
ISSN
0840-7789
Print_ISBN
978-1-4244-5376-4
Electronic_ISBN
0840-7789
Type
conf
DOI
10.1109/CCECE.2010.5575124
Filename
5575124
Link To Document