Title :
A neural network characterization of a HEMT
Author :
Shirakawa, Kazuo ; Okubo, Naofumi
Author_Institution :
Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki 211, Japan. Tel: +81-44-754-2647, Fax: +81-44-754-2646, E-mail: nato@flab.fujitsu.co.jp
Abstract :
We report a new approach to describe the bias-dependent behavior of a HEMT by using a neural network, whose inputs are gate-to-source (Vgs) and gate-to-drain bias voltages (Vds). Using a conventional small-signal equivalent circuit, we characterized the HEMT\´s S-parameters measured at various bias settings, and obtained the bias-dependent values of the equivalent circuit elements. Through experiments, we found that a 5-layered neural network (composed of 28 neurons) is adequate to represent 7 bias-dependent intrinsic elements simultaneously. A "well-trained" neural network shows excellent accuracy.
Keywords :
Electronic mail; Equivalent circuits; HEMTs; Laboratories; Microwave devices; Millimeter wave circuits; Millimeter wave measurements; Neural networks; Neurons; Voltage;
Conference_Titel :
Microwave Conference, 1996. 26th European
Conference_Location :
Prague, Czech Republic
DOI :
10.1109/EUMA.1996.337592