• DocumentCode
    2127464
  • Title

    A neural network characterization of a HEMT

  • Author

    Shirakawa, Kazuo ; Okubo, Naofumi

  • Author_Institution
    Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki 211, Japan. Tel: +81-44-754-2647, Fax: +81-44-754-2646, E-mail: nato@flab.fujitsu.co.jp
  • Volume
    1
  • fYear
    1996
  • fDate
    6-13 Sept. 1996
  • Firstpage
    370
  • Lastpage
    373
  • Abstract
    We report a new approach to describe the bias-dependent behavior of a HEMT by using a neural network, whose inputs are gate-to-source (Vgs) and gate-to-drain bias voltages (Vds). Using a conventional small-signal equivalent circuit, we characterized the HEMT\´s S-parameters measured at various bias settings, and obtained the bias-dependent values of the equivalent circuit elements. Through experiments, we found that a 5-layered neural network (composed of 28 neurons) is adequate to represent 7 bias-dependent intrinsic elements simultaneously. A "well-trained" neural network shows excellent accuracy.
  • Keywords
    Electronic mail; Equivalent circuits; HEMTs; Laboratories; Microwave devices; Millimeter wave circuits; Millimeter wave measurements; Neural networks; Neurons; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1996. 26th European
  • Conference_Location
    Prague, Czech Republic
  • Type

    conf

  • DOI
    10.1109/EUMA.1996.337592
  • Filename
    4138647