Title :
A Bragg silicon lattice comparator [for Avogadro constant determination]
Author :
Alasia, F. ; Basile, G. ; Becker, P. ; Kuetgens, U. ; Stuempel, J. ; Servidori, M. ; Haertwig, J.
Author_Institution :
Ist. di Metrol., CNR, Torino, Italy
Abstract :
The basic principle and results of the feasibility study of a Bragg lattice comparator are described. It combines a Bragg lattice comparator, Hart-Hausermann (H-H) model, with an X-ray angle interferometer for the determination of the angular position of diffraction peaks. Comparisons between Si crystal lattices with an relative uncertainty of 1/spl times/10/sup -8/ are expected.
Keywords :
Constants; Electromagnetic wave interferometers; Goniometers; Lattice constants; Silicon; X-ray diffraction; X-ray diffractometers; Avogadro constant; Bragg lattice comparator; Hart-Hausermann model; Laue diffraction; Si; X-ray angle interferometer; X-ray angular goniometer; angular position; diffraction peaks; lattice constant; lattice standard; relative uncertainty; Crystals; Density measurement; Face detection; Goniometers; Lattices; Silicon; Synchrotron radiation; Uncertainty; Wavelength measurement; X-ray diffraction;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.850907
