Direct measurement for SOI and bulk diodes of single-event-upset charge collection from energetic ions and alpha particles

We describe experiments on charge collection from fluorine ions striking ICs and compare with the collection from alpha particles. The fluorine ion strikes are similar to the energetic heavy ions produced when cosmic-ray-generated neutrons collide with silicon nuclei in an IC. The typical measured charge collection is 10 fC for alpha particles and greater than 100 fC for fluorine ions in bulk diodes. For fluorine ions hitting silicon-on-insulator (SOI) diodes, the charge collection is typically less than 9 fC.