DocumentCode :
2127869
Title :
CMOS interleaved distributed 2 × 3 matrix amplifier employing active post distortion and optimum gate bias linearization technique
Author :
El-Khatib, Ziad ; MacEachern, Leonard ; Mahmoud, Samy A.
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, ON, Canada
fYear :
2010
fDate :
2-5 May 2010
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, the design of a fully-integrated CMOS interleaved distributed 2 × 3 matrix amplifier employing active post distortion and optimum gate bias linearization technique that allows for broadband distortion reduction is presented. Simulation results has yielded a peak S21 power gain of 7.1 dB and then rolls off to a unity gain bandwidth of 16 GHz with less than -10 dB return loss and S12 Isolation less than -45 dB. The simulation results show a 9 dBm IIP3 improvement corresponding to a third-order intermodulation IM3 suppression of 18 dB improvement at output power of -10 dBm. The proposed linearized interleaved distributed 2 × 3 matrix amplifier was designed using the 0.13 μm CMOS technology.
Keywords :
CMOS integrated circuits; distributed amplifiers; integrated circuit design; intermodulation distortion; wideband amplifiers; CMOS interleaved distributed matrix amplifier; S12 isolation; active post distortion; broadband distortion reduction; fully-integrated amplifier; optimum gate bias linearization; output power; return loss; size 0.13 mum; third-order intermodulation IM3 suppression; unity gain bandwidth; CMOS integrated circuits; CMOS technology; Gain; Logic gates; Nonlinear distortion; Semiconductor device modeling; Transmission line matrix methods; Active Post Distortion and Optimum Gate Bias Linearization; CMOS Distributed Interleaved Matrix Amplifier; Third-Order Intermodulation Distortion Suppression; Ultra-Wideband Wireless Communications;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering (CCECE), 2010 23rd Canadian Conference on
Conference_Location :
Calgary, AB
ISSN :
0840-7789
Print_ISBN :
978-1-4244-5376-4
Electronic_ISBN :
0840-7789
Type :
conf
DOI :
10.1109/CCECE.2010.5575149
Filename :
5575149
Link To Document :
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