Title :
Subcarrier fading in UWB OFDM symbols
Author :
Sipal, Vit ; Edwards, David ; Allen, Ben
Author_Institution :
Dept. of Eng. Sci., Univ. of Oxford, Oxford, UK
Abstract :
This paper studies the correlation between subcarriers in ultrawideband OFDM symbols. It is shown that because the channel impulse response can be assumed identical for all subcarriers within the OFDM symbol, the correlation remains strong throughout the symbol. This can be used to determine the probability distribution function of subcarrier fading within the OFDM symbol. These statistics are used for more accurate Bit-Error-Rate (BER) estimation than the standard approach using the assumption of independent BER for each subcarrier.
Keywords :
OFDM modulation; error statistics; fading channels; statistical distributions; ultra wideband communication; BER estimation; UWB OFDM symbol; bit-error-rate; channel impulse response; probability distribution function; statistics; subcarrier correlation; subcarrier fading; ultrawideband OFDM symbol; Bit error rate; Correlation; Estimation; Fading; OFDM; Standards; Wireless communication;
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4673-0461-0
DOI :
10.1109/APS.2012.6348006
