DocumentCode
2128078
Title
Intercomparison of resistance standards with calculable frequency dependence for the characterisation of quantum Hall devices
Author
Melcher, J. ; Bohacek, J. ; Riha, J. ; Von Campenhausen, A. ; Pesel, E.
Author_Institution
Phys. Tech. Bundesanstalt, Braunschweig, Germany
fYear
2000
fDate
14-19 May 2000
Firstpage
176
Lastpage
177
Abstract
We have constructed AC/DC transfer resistance standards with nominal values of 12906.4 /spl Omega/. The design of these resistors follows Gibbings principles [1963]. The resistors differ considerably since bifilar, quadrifilar, and octafilar units have been built. In addition the length of the quadrifilar units was varied.
Keywords
Electric resistance measurement; Measurement uncertainty; Quantum Hall effect; Resistors; Transfer standards; 12906.4 ohm; 400 Hz to 5 kHz; AC-DC transfer standards; bifilar units; calculable frequency dependence; loop elements; octafilar units; quadrifilar units; quantum Hall devices characterisation; relative deviation; resistance standards intercomparison; uncertainty; Copper; Electrical resistance measurement; Frequency dependence; Impedance; Insulation; Petroleum; Resistors; Thermal resistance; Uncertainty; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location
Sydney, NSW, Australia
Print_ISBN
0-7803-5744-2
Type
conf
DOI
10.1109/CPEM.2000.850933
Filename
850933
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