Title :
Density measurements of silicon crystals by hydrostatic weighing
Author :
Fujii, K. ; Waseda, A. ; Kinoshita, M. ; Tanaka, M.
Author_Institution :
Nat. Res. Lab. of Metrol., Ibaraki, Japan
Abstract :
For a determination of the Avogadro constant by the X-ray crystal density (XRCD) method, a primary density standard based was established at NRLM. Based on this standard, a hydrostatic weighing system for comparing the density of solid materials was developed, where the density is determined with a relative combined standard uncertainty of 1.7/spl times/10/sup -7/.
Keywords :
constants; density measurement; measurement standards; measurement uncertainty; silicon; weighing; Avogadro constant; Si; X-ray crystal density method; automated system; crystal density measurements; hydrostatic weighing; primary density standard; relative combined standard uncertainty; Crystalline materials; Crystals; Density measurement; Laboratories; Metrology; Optical interferometry; Silicon; Solids; Standards development; Steel;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.850936
