Density measurements of silicon crystals by hydrostatic weighing

Author

Fujii, K. ; Waseda, A. ; Kinoshita, M. ; Tanaka, M.

Author_Institution

Nat. Res. Lab. of Metrol., Ibaraki, Japan

fYear

2000

fDate

14-19 May 2000

Firstpage

182

Lastpage

183

Abstract

For a determination of the Avogadro constant by the X-ray crystal density (XRCD) method, a primary density standard based was established at NRLM. Based on this standard, a hydrostatic weighing system for comparing the density of solid materials was developed, where the density is determined with a relative combined standard uncertainty of 1.7/spl times/10/sup -7/.

Keywords

constants; density measurement; measurement standards; measurement uncertainty; silicon; weighing; Avogadro constant; Si; X-ray crystal density method; automated system; crystal density measurements; hydrostatic weighing; primary density standard; relative combined standard uncertainty; Crystalline materials; Crystals; Density measurement; Laboratories; Metrology; Optical interferometry; Silicon; Solids; Standards development; Steel;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 2000 Conference on

Conference_Location

Sydney, NSW, Australia

Print_ISBN

0-7803-5744-2

Type

conf

DOI

10.1109/CPEM.2000.850936

Filename

850936

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2128149