Title :
Stochastic analysis for interconnect channels
Author :
Gao, Cong ; Shen, Jianxiang ; Chen, Ji
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Houston, Houston, TX, USA
Abstract :
This paper presents an efficient way to characterize the channel properties due to uncertainties. Sparse grid based stochastic collocation method is applied to the finite difference time domain (FDTD) method for analyzing transmission line structure. Both geometry and signal clock uncertainties are considered in the simulation.
Keywords :
finite difference time-domain analysis; interconnections; microstrip lines; stochastic processes; transmission lines; FDTD method; channel properties; finite difference time domain method; interconnect channels; signal clock uncertainties; sparse grid-based stochastic collocation method; stochastic analysis; transmission line structure; Finite difference methods; Microstrip; Power transmission lines; Standards; Stochastic processes; Time domain analysis; Uncertainty;
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4673-0461-0
DOI :
10.1109/APS.2012.6348013
