Title :
Invited impact of VCSEL scaling on speed and bit energy for high speed interconnects
Author :
Deppe, D. ; Zhao, G. ; Li, M. ; Yang, X.
Author_Institution :
CREOL, College of Optics & Photonics, University of Central Florida, Orlando, FL 32816
Abstract :
Removal of oxide layers from the VCSEL and incorporating AlAs in the low index mirror layers can dramatically decrease the VCSEL´s thermal resistance, and has been shown to increase the stimulated emission rate [1]. These can be scaled down to a much smaller size and maintain high efficiency [2]. Therefore with smaller size, the electrical parasitics can also be reduced.
Keywords :
Bandwidth; Current measurement; Reliability; Stimulated emission; Temperature; Temperature measurement; Vertical cavity surface emitting lasers;
Conference_Titel :
Summer Topicals Meeting Series (SUM), 2015
Conference_Location :
Nassau, Bahamas
Print_ISBN :
978-1-4799-7467-2
DOI :
10.1109/PHOSST.2015.7248234
