• DocumentCode
    2129352
  • Title

    Micro-devices based on spectrum shape deformation

  • Author

    Enguang, Dai

  • Author_Institution
    Key Lab. for the Phys. & Chem. of Nanodevices, Peking Univ., Beijing, China
  • fYear
    2010
  • fDate
    1-4 Nov. 2010
  • Firstpage
    236
  • Lastpage
    239
  • Abstract
    Traditionally, resonate device related sensors are mainly for the detection of resonate peak shift resulting from outer environment disturbance. Besides, there are other types of sensors based upon the peak position detection as well. Electrical frequency spectrum shape or optical spectrum shape deformation are seldom employed as measurand. A new point of view on sensors will be demonstrated both in electrical domain and in optical domain. Different from the detection of the resonate peak, spectrum shape monitoring can provide us with different information.
  • Keywords
    deformation; micromechanical devices; sensors; electrical frequency spectrum shape deformation; micro-device; optical spectrum shape deformation; peak position detection; resonate peak shift;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2010 IEEE
  • Conference_Location
    Kona, HI
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-8170-5
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2010.5690461
  • Filename
    5690461