DocumentCode :
2129353
Title :
Fault tolerance analysis of odd-even transposition sorting networks with single pass and multiple passes
Author :
Salloum, Salam N. ; Wang, Der-Haw
Author_Institution :
California State Polytech. Univ., Pomona, CA, USA
Volume :
1
fYear :
2003
fDate :
28-30 Aug. 2003
Firstpage :
193
Abstract :
The odd-even transposition sorting networks have a simple and reliable VLSI implementation, and also have good fault tolerance properties. In this paper, a formal proof is presented for a well-known conjecture that states the odd-even transposition sorting networks are one-fault tolerant with respect to stuck-at-X fault at any internal comparators. Also, new simulation results are reported for a new mode of operation, sorting via multiple passes through the networks. Under this mode, the simulation results reveal that the odd-even transposition networks are k-fault tolerant with respect to stuck-at-X, stuck-at-H, and stuck-at-T at any set of internal comparators.
Keywords :
VLSI; fault tolerant computing; sorting; Fault tolerance analysis; VLSI implementation; fault tolerance properties; internal comparators; k-fault tolerant; multiple passes; odd-even transposition sorting networks; single pass; stuck-at-X fault; Application software; Asynchronous transfer mode; Database machines; Electronic mail; Fault diagnosis; Fault tolerance; Hardware; Optical computing; Parallel machines; Sorting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, Computers and signal Processing, 2003. PACRIM. 2003 IEEE Pacific Rim Conference on
Print_ISBN :
0-7803-7978-0
Type :
conf
DOI :
10.1109/PACRIM.2003.1235750
Filename :
1235750
Link To Document :
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