Title :
1 volt Josephson fast reversed dc source
Author :
Burroughs, C.J. ; Benz, S.P. ; Harvey, T.E. ; Sasaki, H.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We have made several improvements to the NIST Josephson FRDC (fast reversed dc) source so that it now operates at 1 volt. We have made a precision comparison to a conventional semiconductor FRDC source by measuring the thermoelectric transfer difference of known thermal voltage converts. The agreement between the two sources was measured to be better than 1 part in 10/sup 7/.
Keywords :
measurement standards; superconducting arrays; superconducting integrated circuits; superconductor-normal-superconductor devices; 1 V; Josephson chip; NIST; fast reversed dc source; thermal voltage converts; thermoelectric transfer difference; voltage standards; Government; Josephson junctions; Laboratories; NIST; Semiconductor device measurement; Superconducting devices; Switches; Thermoelectricity; Time measurement; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851015
