• DocumentCode
    2130395
  • Title

    EEG time series analysis with exponential autoregressive modelling

  • Author

    Balli, Tugce ; Palaniappan, Ramaswamy

  • Author_Institution
    Dept. of Comput. & Electron. Syst., Univ. of Essex, Colchester
  • fYear
    2008
  • fDate
    4-7 May 2008
  • Abstract
    This paper proposes the use of exponential autoregressive (EAR) model for modelling of time series that are known to exhibit non-linear dynamics such as random fluctuations of amplitude and frequency. Biological signal (bio-signal) such as electroencephalogram (EEG) is known to exhibit nonlinear dynamics. Such signals cannot be modelled with traditional linear modelling techniques like autoregressive (AR) models as these models are known to provide only an approximation to the underlying properties of the non-linear signals. In this study, the suitability of EAR models as compared to AR models is shown using EEG signals in addition to several non-linear benchmark time series data where improved signal to noise ratio (SNR) values are indicated by the EAR models. Overall, the results indicate that use of EAR modelling which has yet to be exploited for bio-signal time series analysis has the huge potential in the characterisation and classification of EEG signals.
  • Keywords
    autoregressive processes; electroencephalography; medical signal processing; signal classification; time series; EEG signal; biological signal; biosignal; electroencephalogram; exponential autoregressive modelling; nonlinear dynamics; signal classification; signal-to-noise ratio; time series analysis; Biological system modeling; Brain modeling; Ear; Electroencephalography; Fluctuations; Frequency; Genetic algorithms; Signal analysis; Signal to noise ratio; Time series analysis; Electroencephalogram; Exponential autoregressive; Genetic algorithm; Non-linear time series analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2008. CCECE 2008. Canadian Conference on
  • Conference_Location
    Niagara Falls, ON
  • ISSN
    0840-7789
  • Print_ISBN
    978-1-4244-1642-4
  • Electronic_ISBN
    0840-7789
  • Type

    conf

  • DOI
    10.1109/CCECE.2008.4564581
  • Filename
    4564581