DocumentCode :
2130467
Title :
Start-up and sensor/parameter error transients in field oriented induction machines
Author :
Garrigan, Neil R. ; Novotny, Donald W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Volume :
1
fYear :
1995
fDate :
8-12 Oct 1995
Firstpage :
319
Abstract :
This paper presents a tutorial investigation of the dynamic behavior of AC induction machine (IM) indirect field orientation (IFO). Physically intuitive descriptions complimented with analyses and simulations are used to illustrate the dynamics of IM IFO. Specifically, the process of rotor flux build-up from zero under various conditions is investigated. Additionally, how IM IFO systems react to and recover from the effects of sensor errors and estimated machine parameter errors is investigated and illustrated. Complex vectors and their relationship to the controller and machine reference frames are used extensively for both mathematical rigor and intuitive illustrations. In particular, the relative orientation between the controller and actual machine reference frames is exploited for the purposes of tutorial exposition. Computer simulations and known steady state results are used to substantiate and verify the results. It is the goal of this paper to present physically insightful illustrations and explanations, tutorial in nature, of the dynamics associated with IM IFO
Keywords :
controllers; electric sensing devices; error analysis; induction motors; machine control; machine theory; magnetic flux; rotors; starting; transient analysis; computer simulations; controller; dynamic behavior; field oriented induction machines; machine reference frames; parameter error transients; rotor flux build-up; sensor error transients; start-up; Analytical models; Computational modeling; Computer simulation; Control systems; Induction machines; Parameter estimation; Rotors; Sensor systems; Synchronous machines; Torque control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE
Conference_Location :
Orlando, FL
ISSN :
0197-2618
Print_ISBN :
0-7803-3008-0
Type :
conf
DOI :
10.1109/IAS.1995.530317
Filename :
530317
Link To Document :
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