• DocumentCode
    2130539
  • Title

    Electromagnetic scattering measurements on a fractal surface

  • Author

    Ruello, Giuseppe ; Blanco, Pablo ; Iodice, Antonio ; Mallorqui, Jordi J. ; Riccio, Daniele ; Broquetas, Antoni ; Franceschetti, Giorgio

  • Author_Institution
    Dept. of Electron. & Telecommun. Eng., Univ. di Napoli Federico II
  • Volume
    1
  • fYear
    2004
  • fDate
    20-24 Sept. 2004
  • Firstpage
    425
  • Lastpage
    427
  • Abstract
    In this paper we present a procedure devoted to validate innovative theories on the electromagnetic scattering from natural surfaces, using fractal functions for the surface description. A fractal surface has been built as a superposition of cardboard and aluminium layers, according with a computer design based on the Weierstrass-Mandelbrot (WM) fractal function. Its statistical properties have been verified with optical measurements. The electromagnetic field scattered at X band from the built surface has been measured in controlled environment as a function of the incidence angle. Obtained results have been compared with those of the Kirchhoff Approximation (KA) and the Small Perturbation Method (SPM) in conjunction with the fractional Brownian motion (fBm). Congruence and discrepancies of measured data with theoretical results are discussed, providing a validation of the methods
  • Keywords
    Brownian motion; electromagnetic wave scattering; fractals; geophysics computing; Kirchhoff Approximation; Small Perturbation Method; Weierstrass-Mandelbrot fractal function; X band scattering; cardboard/aluminium layer; computer design; electromagnetic scattering theory; fractal surface; fractional Brownian motion; incidence angle function; natural surface; optical measurement; Aluminum; Electromagnetic fields; Electromagnetic measurements; Electromagnetic scattering; Fractals; Kirchhoff´s Law; Optical scattering; Perturbation methods; Quantum computing; Scanning probe microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2004. IGARSS '04. Proceedings. 2004 IEEE International
  • Conference_Location
    Anchorage, AK
  • Print_ISBN
    0-7803-8742-2
  • Type

    conf

  • DOI
    10.1109/IGARSS.2004.1369053
  • Filename
    1369053