Title :
Comparison between the SNS and SIS Josephson voltage standards at OFMET
Author :
Jeanneret, B. ; Rufenacht, A. ; Burroughs, C.J.
Author_Institution :
Swiss Federal Office of Metrol., Bern-Wabern, Switzerland
Abstract :
Recently, a new Josephson voltage standard based on a 1 V programmable chip provided by the National Institute of Standards and Technology (NIST) was implemented at the Swiss Federal Office of Metrology (OFMET). A comparison with a conventional Josephson voltage standard showed a voltage difference of 0.5/spl plusmn/0.8 parts in 10/sup 9/. This preliminary result demonstrates the new system is functioning properly and can be used in various types of measurements. In particular, it will be one of the key components of the Watt balance experiment that is presently under construction at OFMET.
Keywords :
calibration; measurement standards; superconducting arrays; superconductor-insulator-superconductor devices; superconductor-normal-superconductor devices; voltage measurement; 1 V; Josephson voltage standard; SIS Josephson junctions; SNS Josephson junctions; Watt balance experiment; calibration; deviation from linearity; programmable chip; voltage difference; Battery charge measurement; Josephson junctions; Metrology; NIST; Stability; Superconducting devices; Superconducting microwave devices; Time measurement; Voltage; Wires;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851039
