Comparison between the SNS and SIS Josephson voltage standards at OFMET

Author

Jeanneret, B. ; Rufenacht, A. ; Burroughs, C.J.

Author_Institution

Swiss Federal Office of Metrol., Bern-Wabern, Switzerland

fYear

2000

fDate

14-19 May 2000

Firstpage

389

Lastpage

390

Abstract

Recently, a new Josephson voltage standard based on a 1 V programmable chip provided by the National Institute of Standards and Technology (NIST) was implemented at the Swiss Federal Office of Metrology (OFMET). A comparison with a conventional Josephson voltage standard showed a voltage difference of 0.5/spl plusmn/0.8 parts in 10/sup 9/. This preliminary result demonstrates the new system is functioning properly and can be used in various types of measurements. In particular, it will be one of the key components of the Watt balance experiment that is presently under construction at OFMET.

Keywords

calibration; measurement standards; superconducting arrays; superconductor-insulator-superconductor devices; superconductor-normal-superconductor devices; voltage measurement; 1 V; Josephson voltage standard; SIS Josephson junctions; SNS Josephson junctions; Watt balance experiment; calibration; deviation from linearity; programmable chip; voltage difference; Battery charge measurement; Josephson junctions; Metrology; NIST; Stability; Superconducting devices; Superconducting microwave devices; Time measurement; Voltage; Wires;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 2000 Conference on

Conference_Location

Sydney, NSW, Australia

Print_ISBN

0-7803-5744-2

Type

conf

DOI

10.1109/CPEM.2000.851039

Filename

851039