Title :
Development of fast-switching Nb/Al/Nb SNS junctions for the AC Josephson voltage standard
Author :
Lacquaniti, V. ; Maggi, S. ; Monticone, E. ; Polcari, A. ; Rocci, R. ; Steni, R. ; Andreone, D.
Author_Institution :
Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
Abstract :
We report here the current development status of our Nb/Al/Nb SNS Josephson junctions for a programmable voltage standard. The morphology and the electrical parameters of these junctions are strongly dependent on the Al deposition rate. The RF and magnetic field behaviour is also reported, together with preliminary data about the uniformity and reproducibility of the series arrays made with this technology.
Keywords :
Josephson effect; aluminum; critical currents; measurement standards; niobium; sputter deposition; superconducting arrays; superconductor-normal-superconductor devices; voltage measurement; AC Josephson voltage standard; Al deposition rate dependence; Nb-Al-Nb; RF behaviour; fast-switching Nb/Al/Nb SNS junctions; high critical currents; junction electrical parameters; junction morphology; magnetic field behaviour; programmable voltage standard; reproducibility; series arrays; sputter deposition; uniformity; Conductivity; Critical current; Frequency; Josephson junctions; Magnetic fields; Niobium; Reproducibility of results; Standards development; Superconducting device noise; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851043
