Title :
Progress in Josephson voltage standard development
Author :
Hassel, J. ; Seppa, H. ; Gronberg, L. ; Suni, I. ; Helisto, P.
Author_Institution :
VTT Autom. Meas. Technol., Finland
Abstract :
We report recent progress in developing Josephson junction array voltage standards. A new way to realize a programmable voltage standard using externally shunted SIS junctions is tested with experiments and simulations. Further ideas in voltage standard development are presented.
Keywords :
Josephson effect; calibration; measurement standards; programmable circuits; superconducting arrays; superconductor-insulator-superconductor devices; voltage measurement; AC calibration system; I-V curves; Josephson junction arrays; Josephson voltage standard development; critical current scatter; externally shunted SIS junctions; microwave attenuation; programmable voltage standard; Circuits; Conducting materials; Critical current; Electrical resistance measurement; Fabrication; Josephson junctions; Resistors; Semiconductor device measurement; Standards development; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851044
